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Microelectronic Engineering
The numerical method of Shugard, Weeks, and Gilmer is shown to contain systematic errors that prevent it from testing theories of planar and roughening models. © 1982 The American Physical Society.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
E. Burstein
Ferroelectrics
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Surface Science