Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Much recent research aimed at developing high temperature Josephson junctions for electronics applications is based on superconductor-normal metal-superconductor (SNS) edge junctions which, in some instances, exhibit excellent current-voltage characteristics, high critical current-resistance products, and low noise: We review the data available in the published literature and conclude that, despite the useful performance of these junctions, there is little evidence that the behavior of most reported high-Tc SNS devices can be described by conventional proximity effect theory. © 1995 IEEE
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Mark W. Dowley
Solid State Communications
P.C. Pattnaik, D.M. Newns
Physical Review B
R. Ghez, J.S. Lew
Journal of Crystal Growth