Ellen J. Yoffa, David Adler
Physical Review B
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
Ellen J. Yoffa, David Adler
Physical Review B
K.N. Tu
Materials Science and Engineering: A
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics