Frank Stem
C R C Critical Reviews in Solid State Sciences
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
Frank Stem
C R C Critical Reviews in Solid State Sciences
Michiel Sprik
Journal of Physics Condensed Matter
Lawrence Suchow, Norman R. Stemple
JES
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001