R.W. Gammon, E. Courtens, et al.
Physical Review B
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
R.W. Gammon, E. Courtens, et al.
Physical Review B
Ellen J. Yoffa, David Adler
Physical Review B
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering