Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
A large enhancement of the parametrically generated backward-propagating elastic wave in Si: In is reported. The enhancement is observed when the nonlinear interaction between microwave electric and elastic fields occurs at the interface between the Si sample and the sputtered thin-film ZnO ultrasonic transducer. Phase and spectral information is presented. No satisfactory mechanism for the enhancement is known. © 1982 The American Physical Society.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Sung Ho Kim, Oun-Ho Park, et al.
Small
A. Gangulee, F.M. D'Heurle
Thin Solid Films
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials