Conference paper
Structure of the silicon-oxide interface
Yuhai Tu, J. Tersoff
Thin Solid Films
We study surface and bulk equilibrium in Si-Ge alloys by direct simulation. The composition at a reconstructed (100) surface varies with depth in a complex oscillatory way. Lateral ordering occurs even in the fourth layer, driven by the local stress field. The bulk phase diagram is well described by regular solution theory. © 1989 The American Physical Society.
Yuhai Tu, J. Tersoff
Thin Solid Films
F.K. LeGoues, J. Tersoff, et al.
Physical Review Letters
A. Rastelli, M. Stoffel, et al.
Physical Review Letters
J. Tersoff
Applied Physics Letters