Journal of Microscopy

Paper

02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

Oliver C. Wells

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Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

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IC-CPO 2006

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Isolation of type-2 magnetic contrast in the SEM by a lock-in technique

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