A. Gangulee, F.M. D'Heurle
Thin Solid Films
The interlayer penetration depth in layered superconductors may be determined from scanning Superconducting QUantum Interference Device (SQUID) microscope images of interlayer Josephson vortices. We compare our findings at 4 K for single crystals of the organic superconductor κ-(BEDT-TTF)2Cu(NCS)2 and three near-optimally doped cuprate superconductors: La2-xSrxCuO4, (Hg,Cu)Ba2CuO4+δ, and Tl2Ba2CuO6+δ. © 2000 Elsevier Science B.V. All rights reserved.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Michiel Sprik
Journal of Physics Condensed Matter
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME