PaperDefining the "random" spectrum as used in the channeling technique of nuclear backscatteringJ.F. Ziegler, B.L. CrowderApplied Physics Letters
PaperDistribution of damage produced by ion implantation of silicon at room temperatureB.L. Crowder, R.S. TitleRadiation Effects
PaperEffect of O+ and Ne+ implantation on the surface characteristics of thermally oxidized SiN.J. Chou, B.L. CrowderJournal of Applied Physics