PaperDistribution of damage produced by ion implantation of silicon at room temperatureB.L. Crowder, R.S. TitleRadiation Effects
PaperDefining the "random" spectrum as used in the channeling technique of nuclear backscatteringJ.F. Ziegler, B.L. CrowderApplied Physics Letters
PaperBoron atom distributions in ion-implanted silicon by the (n,4He) nuclear reactionJ.F. Ziegler, B.L. Crowder, et al.Applied Physics Letters