IVA-7 Surface Layer Impurity Accumulation Due to Evaporation of GaAs During Annealing

H. Rupprecht, G.D. Pettit, et al.

IEEE JQE

C.L. Chang, K. Mahalingam, et al.

Journal of Electronic Materials

I.M. Vitomirov, A. Raisanen, et al.

Journal of Electronic Materials

R.J. Matyi, M.R. Melloch, et al.

Journal of Crystal Growth