Richard M. Karp, Raymond E. Miller
Journal of Computer and System Sciences
Paper
Optimal recovery of best approximations
Abstract
No abstract available.
Related
Tong Zhang, G.H. Golub, et al.
Linear Algebra and Its Applications
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
John A. Hoffnagle, William D. Hinsberg, et al.
Microlithography 2003