J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Paper
Oxide-charge-induced impurity band in silicon inversion layers
Abstract
No abstract available.
Related
R. Ghez, J.S. Lew
Journal of Crystal Growth
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021