Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
The CO/NH3 plasma chemistry operated under conventional reactive ion etching conditions does not etch NiFe or NiFeCo. However, under high density plasma conditions, etch rates up to ∼500 Å min-1 are obtained for both materials provided optimized ratios of CO and values of ion flux and ion energy are employed. The etch mechanism still has a strong physical component and appears to depend on having sufficient CO to form carbonyl etch products, and to avoid formation of a carbide-like surface layer. Under nonoptimized conditions, the latter can lead to net deposition rather than etching. © 1999 American Vacuum Society.
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP