Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
An investigation of waveguide phase-shifting techniques was conducted for the purpose of establishing the design criteria for a device capable of meeting the following specifications: a phase-shift variable over a minimum range of 360° and a maximum phase error of ±5° at any phase setting over at last a 10 per cent frequency bandwidth. The dielectric loaded waveguide is the basis of a device which meets the design requirements. In this paper the analytical expressions applicable to the dielectric loaded waveguide cross section are derived using the transverse resonance procedure. A rigorous description of the propagation characteristics of this structure for various parameter values is obtained through the use of a high-speed computing machine. The excellent correlation between computed values and the data obtained from an experimental model is presented. © 1962, IEEE. All rights reserved.
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
Frank Stem
C R C Critical Reviews in Solid State Sciences
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
A. Krol, C.J. Sher, et al.
Surface Science