Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
The structure of the initial persistent radicals observed upon UV irradiation of poly(dialkylsilane)s (R2Si)n in solution, at any wavelength absorbed, is -SiR2-SiR-SiR2- as determined by EPR and ENDOR spectroscopy. A mechanism proposed for their formation consists of several steps, initiated by a new photochemical chain-breaking process, reductive elimination on a Si-Si-C unit, with the formation of trialkylsilyl terminal groups. The presence of such terminal groups in the irradiated product was established by GC-MS analysis after exhaustive irradiation at 254 nm. © 1988, American Chemical Society. All rights reserved.
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
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INFORMS 2021