William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
A multiple-wavenumber analysis method for scanned-angle photoelectron holography is refined to image the near-surface atoms at a Cu(001) crystal face. The atoms one layer above the emitter are imaged at the appropriate location although shifted by 0.2Å. To strengthen this analysis, a comparison is made with a simple model which gives a similar result. A theoretical study is also presented that demonstrates why a holographic analysis scheme for scanned-angle diffraction patterns tends to preferentially image forward scattering atoms unlike scanned-energy variants of holographic atom imaging. © 1995.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
John G. Long, Peter C. Searson, et al.
JES
David B. Mitzi
Journal of Materials Chemistry
Michiel Sprik
Journal of Physics Condensed Matter