Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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Abstract

No abstract available.

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Applied Physics Letters

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Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

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Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

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Microscopy and Microanalysis

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Reduction of edge penetration effect in the scanning electron microscope

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Scanning

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