Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Schlieren method as applied to magnetic recording heads in the scanning electron microscope

Oliver C. Wells, Matthias Brunner

Applied Physics Letters

Conference paper

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

Kenneth C.A. Smith, Oliver C. Wells, et al.

IC-CPO 2006

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Magnetic Domains in Thin-Film Recording Heads as Observed in the SEM by a Lock-In Technique

Oliver C. Wells, Richard J. Savoy

IEEE Transactions on Magnetics

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Magnetically filtered low-loss scanning electron microscopy

Oliver C. Wells, Eric Munro

Ultramicroscopy

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