Journal of Microscopy

Paper

02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

Oliver C. Wells, Catherine A. Stoye

Journal of Microscopy

Paper

Magnetic Domains in Thin-Film Recording Heads as Observed in the SEM by a Lock-In Technique

Oliver C. Wells, Richard J. Savoy

IEEE Transactions on Magnetics

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Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

Oliver C. Wells

Journal of Microscopy

Conference paper

Past, present, and future of backscatter electron (BSE) imaging

Oliver C. Wells, Michael S. Gordon, et al.

ScMi 2012

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