Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Our experimental attenuated-total-internal-reflection curves for Ag films are reanalyzed to include the thin contamination layer which has been proposed by W. H. Weber to account for the observed differences in the optical constants at the metal-air and metal-liquid interfaces. In contradiction to Weber's claim, the Drude parameters of the Ag film still show the same behavior as when this adlayer is ignored. © 1986 The American Physical Society.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics