Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
We present an introduction to resonant inelastic soft X-ray scattering (RIXS) spectroscopy as a tool to obtain bandstructure information in broad band solids.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Robert W. Keyes
Physical Review B
Ronald Troutman
Synthetic Metals