Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
We present an introduction to resonant inelastic soft X-ray scattering (RIXS) spectroscopy as a tool to obtain bandstructure information in broad band solids.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
J.H. Stathis, R. Bolam, et al.
INFOS 2005
Frank Stem
C R C Critical Reviews in Solid State Sciences