F.F. Morehead
Physical Review B
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
F.F. Morehead
Physical Review B
W.A. Orr Arienzo, R. Glang, et al.
Journal of Applied Physics
F.F. Morehead
Journal of Materials Research
B.L. Crowder, F.F. Morehead, et al.
Applied Physics Letters