B.L. Crowder, F.F. Morehead
IEEE T-ED
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
B.L. Crowder, F.F. Morehead
IEEE T-ED
F.F. Morehead
Journal of Physics and Chemistry of Solids
F.F. Morehead, G. Mandel
Physical Review
F.F. Morehead
Physical Review B