E. Burstein
Ferroelectrics
A model for reactive Schottky barrier formation is proposed and applied to silicide contacts on silicon. Approximate workfunctions calculated assuming a silicon excess near the silicide/silicon interface reconcile measured barrier heights with a simple Schottky description of their energetics. © 1980.
E. Burstein
Ferroelectrics
J.H. Stathis, R. Bolam, et al.
INFOS 2005
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
H.D. Dulman, R.H. Pantell, et al.
Physical Review B