J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
We report photoemission measurements of valence band critical points, core level binding energies and spin-orbit splittings, and Auger processes using synchrotron radiation in the 20-70 eV range for InSb. Based on our studies of InSb and other semiconductors, several precautions when interpreting photoemission data in this energy range (e.g. Auger processes, matrix elements) are discussed. © 1973.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
J.A. Barker, D. Henderson, et al.
Molecular Physics
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
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EMC 2011