Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
We report photoemission measurements of valence band critical points, core level binding energies and spin-orbit splittings, and Auger processes using synchrotron radiation in the 20-70 eV range for InSb. Based on our studies of InSb and other semiconductors, several precautions when interpreting photoemission data in this energy range (e.g. Auger processes, matrix elements) are discussed. © 1973.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
T.N. Morgan
Semiconductor Science and Technology
M. Hargrove, S.W. Crowder, et al.
IEDM 1998