Paper

01 Jan 1986

VB-2 Laser-Induced Photoemission for Contactless High-Speed IC Testing

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Abstract

No abstract available.

Paper

Definition and measurement rule for voltage resolution of contactless testing systems based on electron-beam or photoemission methods

R. Clauberg, R. Lackmann

Microelectronic Engineering

Paper

Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications

R. Clauberg, H. Beha, et al.

IBM J. Res. Dev

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Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications

R. Clauberg, H. Beha, et al.

IBM J. Res. Dev

Conference paper

Cross-talk and transit-time effects in stroboscopic voltage measurements via electron emission

R. Clauberg, A. Blacha, et al.

Advances in Semiconductors and Semiconductor Structures 1987

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