Voltage detector and sub-micrometer focusing unit for photoemission probing
- R. Clauberg
- A. Blacha
- et al.
- 1990
- Review of Scientific Instruments
Paper
Publications
13 results for A. Blacha
Picosecond photoemission probing of integrated circuits. Capabilities, limitations, and applications
- R. Clauberg
- H. Beha
- et al.
- 1990
- IBM J. Res. Dev
PaperContactless, high-speed: Waveform measurements on gallium arsenide ICs
- H.K. Seitz
- A. Blacha
- et al.
- 1990
- IEEE Design and Test of Computers
PaperHigh electron density effects in electron spectroscopies: Consequences for picosecond photoemission and electron-beam sampling
- Rolf Clauberg
- Armin Blacha
- 1989
- Journal of Applied Physics
PaperProgress in photoemission sampling
- H. Beha
- R. Clauberg
- et al.
- 1989
- CompEuro 1989
Conference paperContactless high-speed waveform measurements on GaAs integrated circuits with the photoemission sampling technique
- H.K. Seitz
- A. Blacha
- et al.
- 1989
- European Test Conference 1989
Conference paperPicosecond photoemission sampling for contactless high speed integrated circuit diagnostics
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paperCross-talk and transit-time effects in stroboscopic voltage measurements via electron emission
- R. Clauberg
- A. Blacha
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paper17ps rise-time measurement by photoemission sampling
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Electronics Letters
PaperPhotoemission sampling technique for high-speed integrated-circuit testing
- H. Beha
- H.K. Seitz
- et al.
- 1987
- Microelectronic Engineering
Paper