Zeitschrift fur Naturforschung - Section A Journal of Physical Sciences

Paper

02 Jun 2014

Zur Röntgen-Fluoreszenz-Analyse dünner Legierungsschichten

Abstract

No abstract available.

Paper

Electron beam evaporation of oriented Nb films onto GaAs crystals in ultrahigh vacuum

M. Eizenberg, D.A. Smith, et al.

Applied Physics Letters

Paper

Observation of X-ray interferences on thin films of amorphous silicon

Armin Segmüller

Thin Solid Films

Paper

Automatic x-ray diffraction measurement of the lattice curvature of substrate wafers for the determination of linear strain patterns

Armin Segmüller, J. Angilelo, et al.

Journal of Applied Physics

Paper

Comment on "Misfit stress in InGaAs/InP heteroepitaxial structures grown by vapor-phase epitaxy" (Journal of Applied Physics (1985) 57 (249))

I.C. Noyan, Armin Segmüller

Journal of Applied Physics

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