Modeling of width-quantization-induced variations in logic FinFETs for 22nm and beyond
- Chung-Hsun Lin
- Wilfried Haensch
- et al.
- 2011
- VLSI Technology 2011
Conference paper
Publications
86 results for Phil Oldiges
Suppression of boron diffusion in deep submicron devices
- Michael A. Gribelyuk
- Phil Oldiges
- et al.
- 2011
- Journal of Vacuum Science and Technology B
PaperStacked devices for SEU immune design
- Phil Oldiges
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE International SOI Conference 2010
Conference paperNon-planar device architecture for 15nm node: FinFET or trigate?
- Chung-Hsun Lin
- Josephine Chang
- et al.
- 2010
- IEEE International SOI Conference 2010
Conference paperCharacterization of parasitic bipolar transistors in 45 nm silicon-on-insulator technology
- Larry Wissel
- Phil Oldiges
- et al.
- 2010
- IEEE TNS
PaperHot-carrier degradation in undoped-body etsoi fets and soi finfets
- Miaomiao Wang
- Pranita Kulkarni
- et al.
- 2010
- IRPS 2010
Conference paperStress liner proximity technique to enhance carrier mobility in high-κ metal gate MOSFETs
- Dechao Guo
- Kathryn Schonenberg
- et al.
- 2009
- MRS Fall Meeting 2009
Conference paperCrystallographic-orientation-dependent gate-induced drain leakage in nanoscale MOSFETs
- Rajan K. Pandey
- Kota V. R. M. Murali
- et al.
- 2010
- IEEE T-ED
PaperIntrinsic effective mobility extraction with extremely scaled gate dielectrics
- Zuoguang Liu
- Dechao Guo
- et al.
- 2010
- Applied Physics Letters
PaperTechnologies to further reduce soft error susceptibility in SOI
- P. Oldiges
- R.H. Dennard
- et al.
- 2009
- IEDM 2009
Conference paper