Direct Partition Measurement of Parasitic Resistance Components in Advanced Transistor Architectures
- Zuoguang Liu
- Heng Wu
- et al.
- 2019
- VLSI Technology 2019
Conference paper
Publications
7 results for Chen Zhang
Technique for Asymmetric Source/Drain Resistance Extraction on a Single Gate Length MOSFET
- Phil Oldiges
- Chen Zhang
- et al.
- 2018
- SISPAD 2018
Conference paperFinFET external resistance analysis by extended shift-and-ratio method
- Chen Zhang
- Zuoguang Liu
- et al.
- 2018
- IEEE T-ED
PaperA review of III-V planar nanowire arrays: Selective lateral VLS epitaxy and 3D transistors
- Chen Zhang
- Xin Miao
- et al.
- 2017
- Journal of Physics D: Applied Physics
ReviewFinFET performance with Si:P and Ge:Group-III-Metal metastable contact trench alloys
- Oleg Gluschenkov
- Zuoguang Liu
- et al.
- 2016
- IEDM 2016
Conference paperSub-10-9 Ω-cm2 n-Type Contact Resistivity for FinFET Technology
- Hiroaki Niimi
- Zuoguang Liu
- et al.
- 2016
- IEEE Electron Device Letters
PaperIII-V nanowire transistors for low-power logic applications: A review and outlook
- Chen Zhang
- Xiuling Li
- 2016
- IEEE T-ED
Paper