Robust bias temperature instability refresh design and methodology for memory cell recovery
- Gerard Touma
- Rouwaida Kanj
- et al.
- 2014
- ICICDT 2014
Conference paper
Publications
50 results for Rouwaida Kanj
Impact of FinFET technology for power gating in nano-scale design
- Keunwoo Kim
- Rouwaida Kanj
- et al.
- 2014
- ISQED 2014
Conference paperNovel 4 GHz interleaved SRAM cells with asymmetrical precharge in 45 nm PDSOI technology
- Rajiv V. Joshi
- Rouwaida Kanj
- et al.
- 2014
- IEEE Trans Semicond Manuf
PaperMaking reliable memories in an unreliable world (invited)
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2013
- IRPS 2013
Conference paperStrained SOI FINFET SRAM design
- Pranita Kerber
- Rouwaida Kanj
- et al.
- 2013
- IEEE Electron Device Letters
PaperHardware-corroborated variability-aware SRAM methodology
- Rajiv Joshi
- Rouwaida Kanj
- et al.
- 2013
- VLSID 2013
Conference paperA thermal and process variation aware MTJ switching model and its applications in soft error analysis
- Peiyuan Wang
- Wei Zhang
- et al.
- 2012
- ICCAD 2012
Conference paperIsolated Preset Architecture for a 32nm SOI embedded DRAM macro
- John Barth
- Don Plass
- et al.
- 2012
- VLSI Circuits 2012
Conference paperA novel sample reuse methodology for fast statistical simulations with applications to manufacturing variability
- Rouwaida Kanj
- Rajiv Joshi
- 2012
- ISQED 2012
Conference paperYield estimation via multi-cones
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2012
- DAC 2012
Conference paper