Publications

3 results for R.E. Stahlbush

Interface states induced by the presence of trapped holes near the silicon-silicon-dioxide interface
- - D.J. DiMaria
  - D.A. Buchanan
  - et al.
- 1995
- Journal of Applied Physics
Paper
Anomalous positive charge formation by atomic hydrogen exposure
- - R.E. Stahlbush
  - E. Cartier
  - et al.
- 1995
- Microelectronic Engineering
Paper
Interface Defect Formation in MOSFETs by Atomic Hydrogen Exposure
- - R.E. Stahlbush
  - E. Cartier
- 1994
- IEEE TNS
Paper