Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
Conference paper
Publications
92 results for Franco Stellari
Hot-carrier luminescence: Comparison of different CMOS technologies
- Alberto Tosi
- Franco Stellari
- et al.
- 2003
- ESSDERC 2003
Conference paperLatchup Analysis Using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- Microelectronics Reliability
Conference paperTransmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Conference paperTransmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Conference paperBackside flip-chip testing by means of high-bandwidth luminescence detection
- A. Tosi
- F. Stellari
- et al.
- 2003
- Microelectronics Reliability
Conference paperFaster IC analysis with PICA spatial temporal photon correlation and CAD autochanneling
- R. Desplats
- A. Eral
- et al.
- 2003
- Microelectronics Reliability
Conference paperCircuit voltage probe based on time-integrated measurements of optical emission from leakage current
- Franco Stellari
- Peilin Song
- et al.
- 2002
- ISTFA 2002
Conference paperCMOS circuit analysis with luminescence measurements and simulations
- F. Stellari
- A. Tosi
- et al.
- 2002
- ESSDERC 2002
Conference paperOptical diagnosis of excess IDDQ in low power CMOS circuits
- Franco Stellari
- Peilin Song
- et al.
- 2002
- Microelectronics Reliability
Conference paper