The impact of hole-induced electromigration on the cycling endurance of phase change memory
- M. H. Lee
- R. Cheek
- et al.
- 2010
- IEDM 2010
Conference paper
Publications
16 results for M. H. Lee
A communication-theoretic approach to phase change storage
- Michele Franceschini
- Luis A. Lastras-Montaño
- et al.
- 2010
- IEEE ICC 2010
Conference paperCharacterization of poly-silicon emitter BJTs as access devices for phase change memory
- B. Rajendran
- M. Breitwisch
- et al.
- 2009
- VLSI-TSA 2009
Conference paperDynamic resistance - A metric for variability characterization of phase-change memory
- Bipin Rajendran
- Matt Breitwisch
- et al.
- 2009
- IEEE Electron Device Letters
PaperPhase change materials and their application to random access memory technology
- Simone Raoux
- Robert M. Shelby
- et al.
- 2008
- Microelectronic Engineering
PaperAnalytical model for RESET operation of phase change memory
- B. Rajendran
- J. Karidis
- et al.
- 2008
- IEDM 2008
Conference paper