Transfer Learning on Edge Using 14nm CMOS-compatible ReRAM Array and Analog In-memory Training Algorithm
- Takashi Ando
- Omobayode Fagbohungbe
- et al.
- 2025
- IEDM 2025
Invited talk
Publications
10 results for Takashi Ando
Monolithic Stacked FET with Stepped Channels for Future Logic Technologies
- Chen Zhang
- Seungmin Song
- et al.
- 2024
- IEDM 2024
Conference paperChallenges in the implementation of artificial intelligence hardware based on phase change devices
- Guy Cohen
- Amlan Majumdar
- et al.
- 2024
- MRS Fall Meeting 2024
Invited talkReversing a decades-long scaling law of dielectric breakdown for ReRAM forming voltage reduction - Modeling competition among defect generation and annihilation processes
- Ernest Y Wu
- Takashi Ando
- et al.
- 2023
- IEDM 2023
Invited talkA Novel Electrical Bias Technique to Recover Degraded ReRAM Arrays for Deep Learning
- Fabia Farlin Athena
- Nanbo Gong
- et al.
- 2023
- MRS Fall Meeting 2023
TalkHardware Algorithm Co-optimization for Scalable Analog Compute Technology
- Takashi Ando
- 2022
- SISC 2022
Invited talkSystematic multiple filament statistical methodology using a successive varying-voltage technique for series resistance effect in post-breakdown (forming) characterization
- Ernest Y Wu
- Baozhen Li
- et al.
- 2022
- IEDM 2022
TalkEffects of Crystallization on the Conductance of HfOx ReRAM by In Situ TEM Method
- Alexandre Foucher
- Baoming Wang
- et al.
- 2022
- MRS Fall Meeting 2022
TalkElectrochemical Control of Resistance States in Metal Oxide Bilayer Stack
- Thomas Defferriere
- Baoming Wang
- et al.
- 2022
- MRS Fall Meeting 2022
TalkMeasuring Ionic Mobility in Oxide Thin Films by Dynamic I-V Analysis–Impact of Interfaces
- Dmitri Kalaev
- Baoming Wang
- et al.
- 2021
- MRS Fall Meeting 2021
Short paper