Optical and Electrical Testing of Latchup in I/O Interface Circuits
- Franco Stellari
- Peilin Song
- et al.
- 2003
- IEEE ITC 2003
Conference paper
Publications
61 results for Alan J. Weger
Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
Conference paperTime-Resolved Optical Measurements from 0.13μm CMOS Technology Microprocessor using a Superconducting Single-Photon Detector
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
Conference paperLatchup Analysis Using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- Microelectronics Reliability
Conference paperTransmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Conference paperTransmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Conference paperFaster IC analysis with PICA spatial temporal photon correlation and CAD autochanneling
- R. Desplats
- A. Eral
- et al.
- 2003
- Microelectronics Reliability
Conference paperPicosecond Imaging Circuit Analysis of Leakage Currents in CMOS Circuits
- Stas Polonsky
- Alan Weger
- et al.
- 2002
- ISTFA 2002
Conference paperTiming characterization of Multiple Timing Domains
- Alan J. Weger
- Moyra McManus
- et al.
- 2002
- ISTFA 2002
Conference paperThe clock distribution of the power4 microprocessor
- Phillip J. Restle
- Craig A. Carter
- et al.
- 2002
- ISSCC 2002
Conference paper