Investigation and Modeling of Multifrequency CV characteristics for 10-nm Bulk FinFETs at Cryogenic Temperatures
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- Asifa Amin
- et al.
- 2024
- Solid-State Electronics
Paper
Publications
22 results for Abhisek Dixit
Compact Model of a Bulk FinFET Quantum Dot Toward Single Chip Integration of Qubits and Control Electronics for Quantum Computing Applications
- Sujit Kumar Singh
- Deepesh Sharma
- et al.
- 2023
- IEEE T-ED
PaperEffective Channel Mobility Extraction and Modeling of 10-nm Bulk CMOS FinFETs in Cryogenic Temperature Operation for Quantum Computing Applications
- Sumreti Gupta
- Sujit Kumar Singh
- et al.
- 2023
- IEEE T-ED
PaperAccurate Modeling of Cryogenic Temperature Effects in 10-nm Bulk CMOS FinFETs Using the BSIM-CMG Model
- Sujit K. Singh
- Sumreti Gupta
- et al.
- 2022
- IEEE Electron Device Letters
PaperImpact of gamma-ray radiation on DC and RF performance of 10-nm bulk n-channel FinFETs
- K. Aditya
- R. Singh
- et al.
- 2020
- IEEE T-DMR
PaperImpact of hot-carrier degradation on drain-induced barrier lowering in multifin SOI n-Channel FinFETs with self-heating
- Charu Gupta
- Anshul Gupta
- et al.
- 2020
- IEEE T-ED
PaperImpact of LER on Mismatch in Nanosheet Transistors for 5nm-CMOS
- Chandan Kumar Jha
- Charu Gupta
- et al.
- 2020
- EDTM 2020
Conference paperComparison of LER induced mismatch in NWFET and NSFET for 5-nm CMOS
- Chandan Kumar Jha
- Pritam Yogi
- et al.
- 2020
- IEEE J-EDS
PaperImpact of Hot Carrier Stress on RF FOMs in 10-nm Bulk N-Channel FinFETs
- Anshul Gupta
- Charu Gupta
- et al.
- 2019
- IIRW 2019
Conference paperReliability Modeling and Analysis of Hot-Carrier Degradation in Multiple-Fin SOI n-Channel FinFETs With Self-Heating
- Anshul Gupta
- Charu Gupta
- et al.
- 2019
- IEEE T-ED
Paper