Hot-carrier charge trapping and reliability in high-K dielectrics
- Arvind Kumar
- Tak H. Ning
- et al.
- 2002
- VLSI Technology 2002
Conference paper
Publications
123 results for Tak H. Ning
Fully-depleted-collector polysilicon-emitter SiGe-base vertical bipolar transistor on SOI
- Jin Cai
- A. Ajmera
- et al.
- 2002
- VLSI Technology 2002
Conference paperWhy BiCMOS and SOI BiCMOS?
- Tak H. Ning
- 2002
- IBM J. Res. Dev
PaperHistory and future perspective of the modern silicon bipolar transistor
- T.H. Ning
- 2001
- IEEE Transactions on Electron Devices
PaperCMOS in the new millenium
- T.H. Ning
- 2000
- CICC 2000
Conference paperSilicon technology directions in the new millennium
- T.H. Ning
- 2000
- IRPS 2000
Conference paperWith SiGe, who needs GaAs?
- T.H. Ning
- 1998
- COMMAD 1998
Conference paperCMOS performance and density trends as we approach 0.1 μm
- T.H. Ning
- 1998
- ICSICT 1998
Conference paperFEOL technology trend
- Yuan Taur
- Tak H. Ning
- 1998
- Materials Chemistry and Physics
ReviewTrends in CMOS technology and application development
- Tak H. Ning
- 1997
- Materials Chemistry and Physics
Paper