Analysis of Local Layout Effects in Field-Effect Transistors Using Neural Networks
- Michael D. Monkowski
- Richard A. Wachnik
- et al.
- 2025
- IEEE Transactions on Electron Devices
Paper
Publications
33 results for Richard A. Wachnik
Symmetry breaking in the drain current of multi-finger transistors
- Ning Lu
- Sungjae Lee
- et al.
- 2015
- CICC 2015
Conference paperModeling of Resistance in FinFET Local Interconnect
- Ning Lu
- Richard A. Wachnik
- 2015
- IEEE TCAS-I
PaperAn Analytical Metal Resistance Model and Its Application for Sub-22-nm Metal-Gate CMOS
- X. Miao
- Ruqiang Bao
- et al.
- 2015
- IEEE Electron Device Letters
PaperExperiment and model for deviation from Pelgrom scaling relation in device width
- Ning Lu
- J. Brown
- et al.
- 2014
- IEDM 2014
Conference paperOff-state self-heating, micro-hot-spots, and stress-induced device considerations in scaled technologies
- Siyu Koswatta
- N. Mavilla
- et al.
- 2015
- IEDM 2015
Conference paperModeling of resistance in FinFET local interconnect
- Ning Lu
- Pooja M. Kotecha
- et al.
- 2014
- CICC 2014
Conference paperVirtual de-embedding study for the accurate extraction of Fin FET gate resistance
- Shireen Warnock
- Rob Groves
- et al.
- 2014
- CICC 2014
Conference paperGate stack resistance and limits to CMOS logic performance
- Richard A. Wachnik
- Sungjae Lee
- et al.
- 2014
- IEEE TCAS-I
PaperGate stack resistance and limits to CMOS logic performance
- Richard A. Wachnik
- S. Lee
- et al.
- 2013
- CICC 2013
Conference paper