Modulating Competition between Defect Generation and Annihilation in Dielectric Breakdown Showing a Full Range of Reverse, Diminishing, and Forward Area Scaling Trends
- Ernest Wu
- Paul Jamison
- et al.
- 2025
- IRPS 2025
Conference paper
Publications
64 results for Ernest Y. Wu
New Loss Function for Learning Dielectric Thickness Distributions and Generative Modeling of Breakdown Lifetime
- Weiman Yan
- Ernest Wu
- et al.
- 2025
- IRPS 2025
Conference paperA New Clustering-Function-Based Formulation of Temporal and Spatial Clustering Model Involving Area Scaling and its Application to Parameter Extraction
- Ernest Wu
- Brian McGowan
- et al.
- 2024
- IRPS 2024
Conference paperGeneral Statistical Model for Dielectric Breakdown Including Reverse Area Scaling - The Role of Area-Dependent Dynamic Competition
- Ernest Wu
- Takashi Ando
- et al.
- 2024
- IRPS 2024
Conference paperA Unified TDDB Model for BEOL Dielectrics of Various Structures and Thick FEOL Dielectrics
- Kenji Okada
- Kei Date
- et al.
- 2024
- IEEE Transactions on Electron Devices
PaperReversing A Decades-Long Scaling Law of Dielectric Breakdown using Hydrogen-Plasma-Treated HfO2 ReRAM Devices
- Ernest Y. Wu
- Takashi Ando
- et al.
- 2023
- Advanced Electronic Materials
PaperMapping and statistical analysis of filaments locations in amorphous HfO2 ReRAM cells
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2023
- Microelectronics Reliability
PaperSemantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions
- Weiman Yan
- Ernest Wu
- et al.
- 2023
- IRPS 2023
Conference paperFilament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2022
- ESSDERC 2022
Conference paperPhoton Emission Microscopy of Amorphous HfO2 ReRAM Cells
- Franco Stellari
- Leonidas E. Ocola
- et al.
- 2022
- IPFA 2022
Conference paper