Resistive Random Access Memory Filament Visualization and Characterization Using Photon Emission Microscopy
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2021
- IEEE Electron Device Letters
Paper
Publications
29 results for Dirk Pfeiffer
Critical BEOL aspects of the fabrication of a thermally-assisted MRAM device
- E.J. O'sullivan
- Daniel C. Edelstein
- et al.
- 2015
- ECS Meeting 2015 Phoenix
Conference paperVerification of untrusted chips using trusted layout and emission measurements
- Franco Stellari
- Peilin Song
- et al.
- 2014
- HOST 2014
Conference paperGraphene technology for RF and THz applications
- Alberto Valdes-Garcia
- Fengnian Xia
- et al.
- 2013
- IMS 2013
Conference paper200 mm wafer-scale integration of sub-20 nm sacrificial nanofluidic channels for manipulating and imaging single DNA molecules
- C. Wang
- S.W. Nam
- et al.
- 2013
- IEDM 2013
Conference paperA novel integrated reliability test system for BEOL TDDB study
- Jifeng Chen
- Peilin Song
- et al.
- 2012
- ISTFA 2012
Conference paperEpitaxial graphene nanoribbon array fabrication using BCP-assisted nanolithography
- Guanxiong Liu
- Yanqing Wu
- et al.
- 2012
- ACS Nano
PaperPhysical characterization of sub-32-nm semiconductor materials and processes using advanced ion beam-based analytical techniques
- M. Hopstaken
- D. Pfeiffer
- et al.
- 2012
- Surface and Interface Analysis
PaperMARVEL Malicious alteration recognition and verification by emission of light
- Peilin Song
- Franco Stellari
- et al.
- 2011
- HOST 2011
Conference paperSputtering behavior and evolution of depth resolution upon low energy ion irradiation of GaAs
- Marinus Hopstaken
- Michael Gordon
- et al.
- 2010
- Journal of Vacuum Science and Technology B
Paper