Atomic hydrogen-induced interface degradation of reoxidized-nitrided silicon dioxide on silicon
- E. Cartier
- D.A. Buchanan
- et al.
- 1994
- Applied Physics Letters
Paper
Publications
182 results for Eduard Cartier
Atomic hydrogen reactions with Pb centers at the (100) Si/SiO2 interface
- J.H. Stathis
- E. Cartier
- 1994
- Physical Review Letters
PaperTheory of high-field electron transport and impact ionization in silicon dioxide
- D. Arnold
- E. Cartier
- et al.
- 1994
- Physical Review B
PaperInterface Defect Formation in MOSFETs by Atomic Hydrogen Exposure
- R.E. Stahlbush
- E. Cartier
- 1994
- IEEE TNS
PaperImpact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
- D.J. DiMaria
- E. Cartier
- et al.
- 1993
- Journal of Applied Physics
PaperImpact ionization in silicon
- E. Cartier
- M.V. Fischetti
- et al.
- 1993
- Applied Physics Letters
PaperPassivation and depassivation of silicon dangling bonds at the Si/SiO 2 interface by atomic hydrogen
- E. Cartier
- J.H. Stathis
- et al.
- 1993
- Applied Physics Letters
PaperImpact ionization, degradation, and breakdown in SiO2
- D.J. Dimaria
- E. Cartier
- et al.
- 1992
- MRS Proceedings 1992
Conference paperHot-electron dynamics in SiO2 and the degradation of the Si/SiO2-interface
- E. Cartier
- D.J. DiMaria
- 1993
- Microelectronic Engineering
PaperTheory of laser-induced free-electron heating and impact ionization in wide-band-gap solids
- D. Arnold
- E. Cartier
- 1992
- Physical Review B
Paper