In situ x-ray diffraction analysis of the C49-C54 titanium silicide phase transformation in narrow lines
- R.A. Roy
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- 1995
- Applied Physics Letters
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Publications
156 results for Jean L. Jordan-Sweet
Relaxed Si0.7Ge0.3 buffer layers for high-mobility devices
- P.M. Mooney
- J.L. Jordan-Sweet
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- 1995
- Applied Physics Letters
PaperEvolution of strain relaxation in step-graded SiGe/Si structures
- P.M. Mooney
- J.L. Jordan-Sweet
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- 1995
- Applied Physics Letters
PaperDislocation nucleation barrier in SiGe/Si structures graded to pure Ge
- P.M. Mooney
- F. Legoues
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- 1994
- Applied Physics Letters
PaperHigh-resolution x-ray diffraction measurements of SiGe/Si structures
- J.L. Jordan-Sweet
- P.M. Mooney
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- 1994
- MRS Fall Meeting 1994
Conference paperEvidence for two-step disordering of the Au(110)-:1 × 2 reconstructed surface
- D.T. Keane
- P.A. Bancel
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- 1991
- Surface Science
PaperSmall-angle x-ray-scattering study of ordering kinetics in a block copolymer
- C.R. Harkless
- M.A. Singh
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- 1990
- Physical Review Letters
PaperElectronic structure of polyimide and related monomers: Theory and experiment
- Steven P. Kowalczyk
- Sven Stafström
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- 1990
- Physical Review B
PaperInstrumentation for millisecond-resolution scattering studies (invited)
- G.B. Stephenson
- K.F. Ludwig Jr.
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- 1989
- Review of Scientific Instruments
PaperObservation of a precursor during the crystallization of amorphous nizr2
- M. Sutton
- Y.S. Yang
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- 1989
- Physical Review Letters
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