Texture of CoSi2 films on Si(111), (110) and (001) substrates
- K. De Keyser
- C. Detavernier
- et al.
- 2010
- Thin Solid Films
Paper
Publications
156 results for Jean L. Jordan-Sweet
Phase formation and stability of Ni silicide contacts - Scaling to ultra-thin films
- C. Detavernier
- K. De Keyser
- et al.
- 2010
- ICSICT 2010
Conference paperHeteroepitaxial silicon film growth at 600 °c from an Al-Si eutectic melt
- P. Chaudhari
- Heejae Shim
- et al.
- 2010
- Thin Solid Films
PaperPhase formation and thermal stability of ultrathin nickel-silicides on Si(100)
- K. De Keyser
- C. Van Bockstael
- et al.
- 2010
- Applied Physics Letters
PaperUnderstanding tunneling magnetoresistance during thermal annealing in MgO-based junctions with CoFeB electrodes
- Weigang Wang
- C. Ni
- et al.
- 2010
- Physical Review B - CMMP
PaperTexture of cobalt germanides on Ge(100) and Ge(111) and its influence on the formation temperature
- K. De Keyser
- R.L. Van Meirhaeghe
- et al.
- 2010
- JES
PaperIrreversible altering of crystalline phase of phase-change Ge-Sb thin films
- Lia Krusin-Elbaum
- D. Shakhvorostov
- et al.
- 2010
- Applied Physics Letters
PaperEffects of annealing on the local structure of Fe and Co in CoFeB/MgO/CoFeB tunnel junctions: An extended x-ray-absorption fine structure study
- Abdul K. Rumaiz
- J.C. Woicik
- et al.
- 2010
- Applied Physics Letters
PaperIn situ X-ray diffraction study of thin film Ir/Si solid state reactions
- W. Knaepen
- J. Demeulemeester
- et al.
- 2010
- Microelectronic Engineering
PaperIn situ study of the formation of silicide phases in amorphous Co-Si mixed layers
- C. Van Bockstael
- K. De Keyser
- et al.
- 2010
- Microelectronic Engineering
Paper