Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
Conference paper
Publications
25 results for Aditya Bansal
Bias Temperature Instability model for digital circuits - Predicting instantaneous FET response
- Aditya Bansal
- Kai Zhao
- et al.
- 2011
- IRPS 2011
Conference paperDouble-Gate MOSFETs with aymmetric drain underlap: A device-circuit co-design and optimization perspective for SRAM
- Ashish Goel
- Sumeet Gupta
- et al.
- 2009
- DRC 2009
Conference paperYield estimation of SRAM circuits using "Virtual SRAM Fab"
- Aditya Bansal
- Rama N. Singh
- et al.
- 2009
- ICCAD 2009
Conference paperImpact of NBTI and PBTI in SRAM bit-cells: Relative sensitivities and guidelines for application-specific target stability/performance
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- IRPS 2009
Conference paperRelaxing conflict between read stability and writability in 6T SRAM cell using asymmetric transistors
- Jae-Joon Kim
- Aditya Bansal
- et al.
- 2009
- IEEE Electron Device Letters
PaperImpacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- Microelectronics Reliability
PaperPre-Si estimation and compensation of SRAM layout deficiencies to achieve target performance and yield
- Aditya Bansal
- Rama N. Singh
- et al.
- 2008
- ICCD 2008
Conference paperAn alternate design paradigm for low-power, low-cost, testable hybrid systems using scaled LTPS TFTs
- Jing Li
- Aditya Bansal
- et al.
- 2008
- ACM JETC
PaperOptimal dual-VT design in sub-100 nanometer PDSOI and double-gate technologies
- Aditya Bansal
- Jae-Joon Kim
- et al.
- 2008
- VLSID 2008
Conference paper