Summary Abstract: High resolution synchrotron photoemission study of silicon-metal interfaces
- P.S. Ho
- 1985
- JVSTA
Paper
Publications
118 results for Paul S. Ho
SOME BASIC PROBLEMS IN VLSI INTERCONNECT.
- P.S. Ho
- 1984
- ECS Meeting 1984
Conference paperBASIC PROBLEMS IN VLSI INTERCONNECT.
- P.S. Ho
- 1984
- ECS Meeting 1984
Conference paperMetal-amorphous silicon-silicon tunnel rectifier
- E.S. Yang
- Q.H. Hua
- et al.
- 1984
- Applied Physics Letters
PaperELECTROMIGRATION STUDIES OF Al-INTERMETALLIC STRUCTURES.
- P.S. Ho
- T. Kwok
- et al.
- 1983
- SSDM 1983
Conference paperChemical and structural aspects of reaction at the Ti/Si interface
- R. Butz
- G.W. Rubloff
- et al.
- 1984
- Physical Review B
PaperComputer simulation of vacancy migration in a fcc tilt boundary
- Thomas Kwok
- Paul S. Ho
- et al.
- 1984
- Surface Science
PaperMolecular-dynamics studies of grain-boundary diffusion. II. Vacancy migration, diffusion mechanism, and kinetics
- Thomas Kwok
- Paul S. Ho
- et al.
- 1984
- Physical Review B
PaperMolecular-dynamics studies of grain-boundary diffusion. I. Structural properties and mobility of point defects
- Thomas Kwok
- Paul S. Ho
- et al.
- 1984
- Physical Review B
PaperChemical Bonding at the Polyimide Surface
- P.O. Hahn
- G.W. Rubloff
- et al.
- 1984
- JVSTA
Paper