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- Zhen Zhang
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- 2010
- IEEE Electron Device Letters
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307 results at IEEE Electron Device Letters
Dual-gate graphene FETs with fT of 50 GHz
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- Hsin-Ying Chiu
- et al.
- 2010
- IEEE Electron Device Letters
PaperVoltage ramp stress for bias temperature instability testing of metal-gate/high- k stacks
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- et al.
- 2009
- IEEE Electron Device Letters
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- Dechao Guo
- et al.
- 2009
- IEEE Electron Device Letters
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- Victor Chan
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- 2009
- IEEE Electron Device Letters
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- Aditya Bansal
- et al.
- 2009
- IEEE Electron Device Letters
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- Adrian Mihai Ionescu
- et al.
- 2009
- IEEE Electron Device Letters
PaperGate length and performance scaling of undoped-body extremely thin SOI MOSFETs
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- Xinlin Wang
- et al.
- 2009
- IEEE Electron Device Letters
PaperDynamic resistance - A metric for variability characterization of phase-change memory
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- Matt Breitwisch
- et al.
- 2009
- IEEE Electron Device Letters
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- 2008
- IEEE Electron Device Letters
Paper