Determination of the inversion-layer thickness from capacitance measurements of metal-oxide-semiconductor field-effect transistors with ultrathin oxide layers
- A. Hartstein
- N.F. Albert
- 1988
- Physical Review B
Paper
Publications
14467 results for Physical Sciences
First-overtone response in modulated photoluminescence emission in silicon at room temperature
- D. Guidotti
- J.S. Batchelder
- et al.
- 1988
- Physical Review B
PaperStrained Si/Ge superlattices: Structural stability, growth, and electronic properties
- S. Ciraci
- Inder P. Batra
- 1988
- Physical Review B
PaperOptical characterization and band offsets in ZnSe-ZnSxSe1-x strained-layer superlattices
- Khalid Shahzad
- Diego J. Olego
- et al.
- 1988
- Physical Review B
PaperOptical properties of crystalline semiconductors and dielectrics
- A.R. Forouhi
- I. Bloomer
- 1988
- Physical Review B
PaperStructure determination of the Ge(111)-c(2×8) surface by medium-energy ion scattering
- P.M.J. Marée
- K. Nakagawa
- et al.
- 1988
- Physical Review B
PaperMagnetism in bcc 3d transition metals: Onset and approach to the Hunds-rule limit
- V.L. Moruzzi
- P.M. Marcus
- 1988
- Physical Review B
PaperEffect of sample doping level during etching of silicon by fluorine atoms
- J.A. Yarmoff
- F.R. McFeely
- 1988
- Physical Review B
PaperElectronic spectroscopy of zero-dimensional systems
- T.P. Smith III
- K.Y. Lee
- et al.
- 1988
- Physical Review B
PaperTheory of resonant tunneling in heterostructures
- Peter J. Price
- 1988
- Physical Review B
Paper