Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure
- A. Erbil
- G.S. Cargill Iii
- et al.
- 1988
- Physical Review B
Paper
Publications
14462 results for Physical Sciences
Surface metallization of silicon by potassium adsorption on Si(001)-(2×1)
- S. Ciraci
- Inder P. Batra
- 1988
- Physical Review B
PaperPreparation and properties of resistive films
- K.K. Shih
- A. Aviram
- et al.
- 1988
- Thin Solid Films
PaperStructural perfection of the Si(111)-(1×1) As surface
- M. Copel
- R.M. Tromp
- 1988
- Physical Review B
PaperCharacterization of logic devices with photoconductively generated picosecond pulses
- J.-M. Halbout
- P.G. May
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paperFundamentals of laser photoemission for testing high speed devices and circuits
- G.W. Rubloff
- H. Beha
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paperPicosecond photoemission sampling for contactless high speed integrated circuit diagnostics
- A. Blacha
- R. Clauberg
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paperMeasurement considerations for future high speed computer packaging
- G.V. Kopcsay
- G. Arjavalingam
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paperHigh performance silicon bipolar technology
- G.-P. Li
- M.B. Ketchen
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paperPhotoelectron scanning electron microscope (PSEM) for high speed noncontact testing
- P.G. May
- J.-M. Halbout
- et al.
- 1987
- Advances in Semiconductors and Semiconductor Structures 1987
Conference paper