Statistical pattern recognition: A review
- Anil K. Jain
- Robert P. W. Duin
- et al.
- 2000
- IEEE Transactions on Pattern Analysis and Machine Intelligence
Paper
Publications
24866 results for Exploratory Science
Relative adhesion measurement for thin film microelectronics structures
- L.P. Buchwalter
- 2000
- Journal of Adhesion
PaperRealization of high-Tc dc π-SQUIDs
- R.R. Schulz
- B. Chesca
- et al.
- 2000
- Physica C: Superconductivity and its Applications
PaperCurrent decay from quantum tunneling of vortices in Bi-2212 superconductors
- J.R. Thompson
- J.G. Ossandon
- et al.
- 2000
- Physica C: Superconductivity and its Applications
PaperProgress in 193nm resists: Impact of the development process on anhydride-containing resist materials
- Robert D. Allen
- Carl E. Larson
- et al.
- 2000
- J. Photopolym. Sci. Tech.
PaperInterlayer phase coherence in the vortex matter phases of Bi2Sr2CaCu2O8+y
- T. Shibauchi
- T. Nakano
- et al.
- 2000
- Physica C: Superconductivity and its Applications
PaperFuture of CMOS technology
- Randall D. Isaac
- 2000
- IBM J. Res. Dev
PaperExtremely high-density longitudinal magnetic recording media
- Dieter Weller
- Mary F. Doerner
- 2000
- Annual Review of Materials Science
PaperC-axis tunneling in Bi2Sr2CaCu2O8+δ in the magnetic field up to 60 T
- N. Morozov
- L. Krusin-Elbaum
- et al.
- 2000
- Physica C: Superconductivity and its Applications
PaperThe effect of edge roughness on magnetization reversal in micron-sized permalloy thin films
- J.G. Deak
- R.H. Koch
- 2000
- Journal of Magnetism and Magnetic Materials
Paper