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- E. Feig
- F.P. Greenleaf
- 1999
- Inverse Problems
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Publications
26914 results for Science
Effects of annealing conditions on charge loss mechanisms in MOCVD Ba0·7Sr0·3TiO3 thin film capacitors
- J.D. Baniecki
- R.B. Laibowitz
- et al.
- 1999
- Journal of the European Ceramic Society
PaperConservative and dissipative interactions in dynamic force microscopy
- U. Dürig
- 1999
- Surface and Interface Analysis
PaperA modified voigt method for calculation of the elastic constants of ensembles selected by diffraction methods
- Conal E. Murray
- I.C. Noyan
- 1999
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
PaperCMOS scaling beyond 0.1 μm: how far can it go?
- Y. Taur
- 1999
- International Symposium on VLSI Technology, Systems, and Applications, Proceedings
PaperPractical resolution limit of KrF lithography
- Ralf Schuster
- 1999
- International Symposium on VLSI Technology, Systems, and Applications, Proceedings
PaperCyclic olefm resist polymers and polymerizations for improved etch resistance
- R.D. Allen
- Juliann Opitz
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- 1999
- J. Photopolym. Sci. Tech.
PaperElectrical properties of copper-silicon Schottky barriers
- M.O. Aboelfotoh
- B.G. Svensson
- 1999
- Semiconductor Science and Technology
PaperAdiabatic treatments of vibrational dynamics in low-energy electron-molecule scattering
- S. Mazevet
- Michael A. Morrison
- et al.
- 1999
- Journal of Physics B
PaperDevelopment of lead (Pb)-free interconnection materials for microelectronics
- Sung K. Kang
- 1999
- Metals and Materials International
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