Scaling silicon MOS devices to their limits
- S.J. Wind
- D.J. Frank
- et al.
- 1996
- Microelectronic Engineering
Paper
Publications
24879 results for Exploratory Science
Nanolithography with an atomic force microscope
- M. Wendel
- B. Irmer
- et al.
- 1996
- Superlattices and Microstructures
PaperWeak fluence dependence of charge generation in ultra-thin oxides on silicon
- K.R. Farmer
- C.P. Debauche
- et al.
- 1996
- Applied Surface Science
PaperA fast parallel algorithm for finding the convex hull of a sorted point set
- Omer Berkman
- Baruch Schieber
- et al.
- 1996
- International Journal of Computational Geometry and Applications
PaperSpin dependent carrier localization in Fe-based semimagnetic semiconductor heterostrucrures
- B.T. Jonker
- H. Abad
- et al.
- 1996
- Journal of Crystal Growth
PaperEnergy spread in liquid metal ion sources at low currents
- J.C. Beckman
- T.H.P. Chang
- et al.
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperAutomatic defect classification for semiconductor manufacturing
- Paul B. Chou
- A. Ravishankar Rao
- et al.
- 1996
- Machine Vision and Applications
PaperAtomic resolution in dynamic force microscopy across steps on Si(111)7 × 7
- R. Lüthi
- E. Meyer
- et al.
- 1996
- Zeitschrift fur Physik B-Condensed Matter
PaperStudy of buried interfaces by soft x-ray fluorescence spectroscopy excited by synchrotron radiation
- D.L. Ederer
- J.A. Carlisle
- et al.
- 1996
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperInfluence of structure on smectic A-smectic a phase separation
- P. Gorria
- H.T. Nguyen
- et al.
- 1996
- Liquid Crystals
Paper