A comparison of C54-TiSi2 formation in blanket and submicron gate structures using in situ x-ray diffraction during rapid thermal annealing
- J. Bucchignano
- G.B. Stephenson
- et al.
- 1995
- Journal of Materials Research
Paper
Publications
24906 results for Exploratory Science
Characterization of vapor phase growth using X-ray techniques
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1995
- Journal of Crystal Growth
PaperDesign and Performance Aspects of Pickup Loop Structures for Miniature SQUID Magnetometry
- M.B. Ketchen
- J.R. Kirtley
- 1995
- IEEE TAS
PaperInvestigation of the relationship between reflectance difference spectroscopy and surface structure using grazing incidence X‐ray scattering
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1995
- physica status solidi (a)
PaperPerformance of fiber-optic data links using 670-nm cw VCSELs and a monolithic Si photodetector and CMOS preamplifier
- D. Kuchta
- H. Ainspan
- et al.
- 1995
- IBM J. Res. Dev
PaperA new ordered oxygen-deficient perovskite Sm2Sr6Cu8O17+δ: HREM Study of PLD Thin Films
- B. Mercey
- A. Gupta
- et al.
- 1995
- Journal of Solid State Chemistry
PaperThe Krypto Knight Family of Light-Weight Protocols for Authentication and Key Distribution
- Ray Bird
- Inder Gopal
- et al.
- 1995
- IEEE/ACM Transactions on Networking
PaperControlling the use of cryptographic keys
- Christopher J Holloway
- 1995
- Computers and Security
PaperCrosslinked polyimide foams derived from pyromellitic dianhydride and 1,1-bis(4-aminophenyl)-1-phenyl-2,2,3-trifluoroethane with poly(α-methylstyrene)
- Y. Charlier
- J.L. Hedrick
- et al.
- 1995
- Polymer
PaperFilling dual damascene interconnect structures with AlCu and Cu using ionized magnetron deposition
- S.M. Rossnagel
- 1995
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper