Parametric kinematic tolerance analysis of general planar systems
- Elisha Sacks
- Leo Joskowicz
- 1998
- CAD Computer Aided Design
Paper
Publications
26932 results for Science
Challenges and progress in x-ray lithography
- Jerome P. Silverman
- 1998
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperPerforming work efficiently in the presence of faults
- Cynthia Dwork
- 1998
- SIAM Journal on Computing
PaperSurface-influenced phase separation in organic thin films on drying
- Ravi F. Saraf
- Steve Ostrander
- et al.
- 1998
- Langmuir
PaperLateral manipulation of single adsorbates and substrate atoms with the scanning tunneling microscope
- G. Meyer
- K.H. Rieder
- 1998
- MRS Bulletin
PaperInternet security incidents, a survey within Dutch organizations
- Martin Caminada
- Reind Van De Riet
- et al.
- 1998
- Computers and Security
PaperThe IBM JBICB-ABIC Verification Suite
- P.S. Colyer
- Joan L. Mitchell
- 1998
- IBM J. Res. Dev
PaperSurvey of backward error recovery techniques for multicomputers based on checkpointing and rollback
- G. Deconinck
- J. Vounckx
- et al.
- 1998
- International Journal of Modelling and Simulation
ReviewDensity-Functional Theory and Molecular Dynamics: A New Perspective for Simulations of Biological Systems
- Wanda Andreoni
- 1998
- Perspectives in Drug Discovery and Design
ReviewComparison of secondary ion mass spectrometry profiling of sub-100 nm ultrashallow junctions using NO+2 and O+2 sputtering
- P.A. Ronsheim
- K.L. Lee
- 1998
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Review